2025.3.6

Focus on innovation and light the future | Giant Testing invites you to attend the 2025 Munich Shanghai Expo!
Spring is here, and everything is renewed. From March 11 to 13, 2025, the LASER World of Photonics (Shanghai), the annual event for the laser, optics, and optoelectronics industries in Asia, will celebrate its 20th anniversary at the Shanghai New International Expo Center.
This exhibition has a total of 9 exhibition halls, an increase of 34% over the previous one, covering Halls N1-N5 and E4-E7. With a larger scale, better products, and more supporting activities, it connects supply and demand resources, and provides strong backing and strong support for science and technology-led high-quality development.
LASER World of PHOTONICS CHINA in Shanghai covers all aspects of the laser and optical industry, bringing together research and industrial applications. Instrument Systems will join hands with Giant Optics to appear at the exhibition. We sincerely invite you to visit and exchange ideas, and explore the cutting-edge trends of optoelectronic technology and opportunities for industrial cooperation.
Exhibition time: March 11-13, 2025
Exhibition location: Shanghai New International Expo Center - Entrance Hall 3, Halls N1-N5, E7-E4
Transportation Guide: Take Metro Line 7 Huamu Road Station Exit 1, or drive to P2 parking lot.
Our Product Highlights
CoboTop - Automated solution for AR/VR testing
LumiTop AR/VR - Near-Eye Display Measurement System
LumiTop display measurement system
Lighting source for XR equipment measurement
DMS 904 - Automotive Curved Display Measurement System
VTC - VCSEL Measurement System
Collision of ideas, insight into the future
More than 200 technical conferences will be held during the exhibition, covering cutting-edge topics such as ultrafast lasers and quantum detection.
International Conference on Laser and Quantum Light
The United Nations has declared 2025 the International Year of Quantum Science and Technology (IYQ). The conference will focus on discussing the trend research progress and future application prospects of laser and quantum technology, and is committed to building an international exchange platform for deep integration of academia and industry.
Optical Technology Conference
Focusing on hot topics in the industry, the topics include the latest scientific and technological research and development results and progress in computational optical imaging technology, meta-optical surface technology, semiconductor optical technology, optical micro-nano detection, infrared detection technology, lasers, laser technology, etc. At the same time, the conference will focus on application scenarios such as semiconductors, new energy, automotive engineering, artificial intelligence, biomedicine, etc., and there will be the addition of multiple optical theme training courses to bring more professional courses to optoelectronics people.
Book a visit
Scan the QR code below to make an appointment in advance to receive a visitor pass. We have prepared exquisite gifts and look forward to meeting you at booth E7.7406 to let our innovative solutions inspire you. Looking forward to seeing you!
Scan the QR code to get a free visitor pass
Giant Testing has been deeply involved in the field of optics for more than ten years and is committed to providing customers with innovative and reliable measurement technology support. This Optical Fair is not only a product display, but also an excellent opportunity to communicate with you face to face and seek common development. Whether you are seeking technological breakthroughs or exploring the possibility of cooperation, the Jingen team is ready and looks forward to talking about the future with you!
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2024.3.13

Meet at 2024 Laser Photonics China and experience the global optoelectronics festival
As a grand event for the laser, optics, and optoelectronics industries in Asia, the 2024 Munich Shanghai Expo will be grandly opened at the Shanghai New International Expo Center from March 20 to 22. Optical technology and laser technology play a key role in semiconductor testing, chip manufacturing, new energy vehicle manufacturing and other fields, greatly promoting the country's informatization construction and economic development.
At this event, Instrument Systems will co-exhibit with Giant Optics to showcase cutting-edge measurement technology from Germany and provide consulting services based on your measurement needs.
Our booth is located at Hall W4 4417 , and we look forward to seeing you!
Instrument Systems will be showcasing a range of proven and innovative solutions in the areas of display technology, augmented reality/virtual reality (AR/VR) and vertical cavity surface emitting laser (VCSEL) measurement. A highlight of our booth at this year's show is the new generation of large-size and curved display measurement solutions. The fully automatic 7-axis DMS 904 goniometer is designed for optical property testing of large-size displays, including Pillar-to-Pillar displays that span the entire width of the vehicle.
Several experienced optical measurement technicians will introduce you to optical measurement technology on site and provide the most suitable solution for your measurement needs. We look forward to your visit!
Our measurement applications
Display production measurement
The LumiTop 4000 display system measures display uniformity, color cast, flicker, gamma, defect detection (mura) and other characteristics in one stop.
AR/VR Measurement
LumiTop AR/VR and DMS goniometer systems can inspect and correct the uniformity, contrast, angle dependence and color fidelity of near-eye displays.
MicroLED Measurements
LumiTop X150 high-resolution imaging colorimetry system for sub-pixel analysis and pixel defect testing of OLED and MicroLED displays.
Large vehicle display screen measurement
DMS 904 goniometer has 7-axis linkage to accurately measure the display's photoelectric conversion characteristics (EOTF), switching speed, response time, flicker, etc.
VCSEL Measurements
The VTC and PVT series VCSEL measurement systems can perform eye safety tests on VCSEL lasers according to the international laser safety standard IEC60825, including far-field, near-field and nanosecond pulse measurements.
IR/NIR Measurements
The infrared measurement system with the CAS 140D IR high-end spectrometer as the core can measure the spectrum, power, LIV curve, temperature dependence of optical output and angle resolution measurement of infrared and near-infrared light sources.
We look forward to seeing you at the 2024 Shanghai Munich Expo!
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2024.1.31

2D LIV, spectrum, and beam characteristics of individual emitters in VCSEL arrays
VCSEL arrays are found to have numerous applications in consumer electronics, including structured light sources in time-of-flight (ToF) or 3D sensing, proximity lighting in face recognition (FR), gesture recognition (GR), etc. This study focuses on detailed and comprehensive LIV testing, spectral and beam analysis of the entire VCSEL array and each emitter within it.
Necessity of 2D LIV+λ detection for single emitters
Essential for demanding applications such as facial recognition, 3D sensing, in-cabin sensing, LiDAR and range finding
Investigating crosstalk between transmitters
Parallelize measurements to reduce overall measurement time
LIV curves are the most basic measurement method used to determine the electrical and optical operating characteristics of laser diodes. These curves establish the threshold current, slope efficiency, flip point, whether there are any kinks, etc. They are widely used at different stages because it is critical to identify faulty DUTs early in the manufacturing process.
LIV characteristics of the entire VCSEL array
Measure LI and IV curves of the entire array from 200 mA to 1.8 A
Calculate the slope efficiency, threshold current and flip current based on the LI curve
In the IV curve, the voltage increases approximately linearly with the expected current.
LIV characteristics of all emitters in the entire array
The VCSEL array used in this measurement consists of 281 emitters.
The slope efficiency and threshold current of each emitter were measured
External emitter has higher slope efficiency but lower threshold current
Internal emitters have small variations in both quantities
In addition to the LIV curves, we also measured spectra of individual emitters (15 emitters were selected for the array) at different currents, similar to the LIV curves. The spectra are shown in the figure below. Each sub-figure represents an emitter, and its spectrum is color-coded at different currents (blue at 400 mA to red at 1.8 A). We observe a shift in the spectrum at higher currents, and higher-order modes also appear as the current increases.
\\ in conclusion
We have extended the existing 1D LIV testing, spectroscopy and beam analysis to cover every single emitter in the VCSEL array. This approach not only enables parallelization of the measurements, reducing the overall measurement time, but also provides the opportunity to study the mutual influence between individual emitters.
VTC 4000: Flexible and precise single emitter analysis
Our unique measurement solution, with well-defined requirements from customers, allows identification of emitters in an array that are underperforming or out of specification. We believe that this comprehensive characterization of individual emitters is critical for demanding applications. This allows VCSEL manufacturers to ensure compliance of the final product without incurring any packaging costs and speed up the manufacturing process.
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2023.10.8

New Product Launch│ LumiTop X20/X30 Imaging Colorimeter
\\ The LumiTop X20 and X30 imaging colorimeters recently released by Instrument Systems of Germany provide advanced solutions for display testing under special brightness conditions. These two colorimeters have excellent performance, including high resolution (20 MP and 31 MP) and a wide dynamic range (from mcd/m² to Mcd/m²), which are particularly suitable for uniformity measurement and error detection.
LumiTop X20 and LumiTop X30 are designed for production testing of displays at specific brightness levels. The spectrally optimized LumiTop technology is trusted by customers as a powerful tool for display quality assurance. This technology enables display manufacturers to test over a wide range of brightness levels, from high brightness levels of hundreds of Mcd/m² to low brightness levels of 0.001 cd/m² to 0.1 cd/m², taking into account the human eye's adaptability to different brightness levels.
Today's displays have advanced brightness features that can intelligently adjust brightness to improve user experience and reduce eye fatigue. Therefore, accurate brightness and color testing is critical when designing and manufacturing displays, especially for performance testing under low-light conditions. LumiTopX20 and X30 imaging colorimeters are equipped with high-resolution cameras (20MP and 31MP), flexible field of view (FOV) achieved by high-precision motorized lenses, and a wide dynamic range, making them ideal measurement tools.
In addition to the outstanding design, the LumiTop X20 and X30 also feature a new flicker sensor for the frequency range of 1 Hz to 1 kHz. Through the LumiTop series of imaging colorimeters, combined with high-resolution cameras, fast photometers, flicker sensors and CAS high-precision spectrometers, Instrument Systems continues to lead the field of display measurement technology, providing reliable assurance of display quality under low and high brightness conditions.
LumiTop measurement solutions are the industry’s trusted standard for display measurement. If you have any questions about display and Mini/MicroLED measurement, please feel free to contact us ([email protected])to get solutions from Giant-Testing’s optical measurement team.
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2023.9.25

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2023.9.25

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2023.1.12

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2023.3.22

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2023.4.11

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